IIIT-Delhi Institutional Repository

Browsing by Subject "Memory Reliability"

Browsing by Subject "Memory Reliability"

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  • Rout, Sidhartha Sankar; Deb, Sujay (Advisor) (2014-07-10)
    The growing technology scaling and larger die size of multi-processor System-on-Chip (SoC) have increased the error rates for on-chip memories. Increased system speed for high performance, aggressive voltage scaling for ...

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