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Please use this identifier to cite or link to this item: http://repository.iiitd.edu.in/xmlui/handle/123456789/1638
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dc.contributor.authorMamodia, Shivani
dc.contributor.authorSubramanyam, A V (Advisor)
dc.date.accessioned2024-06-13T12:06:04Z
dc.date.available2024-06-13T12:06:04Z
dc.date.issued2020-07-01
dc.identifier.urihttp://repository.iiitd.edu.in/xmlui/handle/123456789/1638
dc.language.isoen_USen_US
dc.publisherIIIT-Delhien_US
dc.titleReducing test time using regression algorithms in post silicon validationen_US
dc.typeThesisen_US
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