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Please use this identifier to cite or link to this item: http://repository.iiitd.edu.in/xmlui/handle/123456789/1638
Title: Reducing test time using regression algorithms in post silicon validation
Authors: Mamodia, Shivani
Subramanyam, A V (Advisor)
Issue Date: 1-Jul-2020
Publisher: IIIT-Delhi
URI: http://repository.iiitd.edu.in/xmlui/handle/123456789/1638
Appears in Collections:Year-2020

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