IIIT-Delhi Institutional Repository

Development of large language models and tools to study patents and develop insights

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dc.contributor.author Soam, Satyam Singh
dc.contributor.author Grover, Anuj (Advisor)
dc.date.accessioned 2026-04-09T14:03:43Z
dc.date.available 2026-04-09T14:03:43Z
dc.date.issued 2024-11-29
dc.identifier.uri http://repository.iiitd.edu.in/xmlui/handle/123456789/1866
dc.description.abstract The project titled "Development of Large Language Models and Tools to Study Patents and Develop Insights" aims to use advanced AI to help analyze and understand patent information better. With more patents being filed each year, there is an increasing need for tools that can handle lots of information and find useful insights. This project focuses on creating and using large language models (LLMs) designed to read, analyze, and summarize patent documents. The main functionality of this project is to provide detailed information about patents, like titles, summaries, claims, inventors, filing dates, and legal status. By making use of advanced natural language processing (NLP) techniques, this project will automatically extract and organize this information, making it easy to find and search. The project will also include tools to spot trends, perform smart searches, and create insights from patent data, helping researchers, inventors, and legal professionals. The successful completion of this project will create a strong platform that makes it easier to get and analyze patent information and offers advanced features for deeper insights into patents, technology, and innovation trends. This will save time and effort in patent analysis, help make better decisions, and give a better understanding of global innovation. The platform will also support comparing studies and competitive intelligence, giving users an advantage in their fields. en_US
dc.language.iso en_US en_US
dc.publisher IIIT-Delhi en_US
dc.subject Large Language Models en_US
dc.subject Patents en_US
dc.title Development of large language models and tools to study patents and develop insights en_US
dc.type Other en_US


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