Abstract:
State of the art automotive microcontrollers (MCUs) implementing complex system-on-chip (SoC) architectures requires often additional functional
patterns to achieve high degree of reliability. Functional pattern family includes test patterns checking internal device functionality under nominal
condition. The development of these patterns is required to augment structural tests to achieve high test coverage. Moreover, it should be planned to
minimize test time since it has direct impact on time to market. This thesis
proposes a reusable and time-economized approach for functional test pattern development aimed for production tests using Test Information Model
(TIM) discussed. The
flow is also automated to exclude the potential source
of error in the pattern generation. In applying this methodology, there is
approximately 60%-70% reduction in pattern time as compared to conventional simulation based pattern development which required cyclization of
simulation data to be compatible to testers used for production tests. Moreover, proposed automated production test pattern development activity is
smooth as compared to manual approach and its availability is also aligned
with the first veri ed RTL. Also, the results show the e fficiency of this approach in terms of pattern re-usability by further reducing man-hours of
the test engineer.
