Abstract:
The growing gap between the processor and embedded memory speed is a major setback in the overall performance of electronic systems. Since the sense amplifier (SA) forms an integral part of the read circuitry in both volatile memories, such as SRAM, and non-volatile memories (NVMs), such as FLASH, its performance has a significant effect on the overall performance of memory. Access time, offset, power and area are the four important performance metrics of SA. The memory access time and input-offset of SA greatly affect the speed of the entire memory and therefore to patch up the gap between processor and memory speed, the SA is required to be fast and efficient. As one SA is employed for each bitline in the memory array, it is required to be compact in size and should have low power consumption. Furthermore scaling in technology makes it difficult to control the fabrication process leading to variation in process parameters causing unpredictability in the performance of SAs. Therefore, it is very important to keep this aspect in mind while designing and estimating the performance metrics of the SA.
This thesis includes the study of various conventional SA designs in detail so as to have a better understanding of a basic SA and its operation and thus helping in understanding what problems are faced by designers in implementing the SA designs and how these problems can be tackled. In addition to the conventional SA analysis, new sense amplifier designs have been proposed for both current sensing in FLASH memory and voltage sensing in SRAM. Keeping the variation in process parameters due to scaling in mind, these proposed designs have been optimized in terms of access time, offset, power and area.
