IIIT-Delhi Institutional Repository

Browsing Year-2017 by Subject "Soft error"

Browsing Year-2017 by Subject "Soft error"

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  • Garg, Sakshi; Hashmi, Mohammad S. (Advisor) (2017)
    Moving towards deep-submicron technologies, packaging density of ICs is increasing and thus the number of storage elements is also increasing on an IC. Any data corruption in these storage elements leads to huge amount of ...

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